Statistical Method for Testing of Sigma-Delta Converters

Authors

  • J. Vedral
  • J. Holub

DOI:

https://doi.org/10.14311/92

Abstract

Measurement and testing methodology for 2-channel insulated measuring module based S - D on Analog-to-Digital converter AD7710 that has a nominal resolution 16(24) bits is presented. The dependencies of effective resolution on the first notch frequency and gain are given.

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Author Biographies

  • J. Vedral
  • J. Holub

Published

2000-01-03

Issue

Vol. 40 No. 3 (2000)

Section

Articles

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How to Cite

Vedral, J., & Holub, J. (2000). Statistical Method for Testing of Sigma-Delta Converters. Acta Polytechnica, 40(3). https://doi.org/10.14311/92