BENDA, V. Present Problems of Reliability of Power Semiconductor Devices. Acta Polytechnica, [S. l.], v. 40, n. 3, 2000. DOI: 10.14311/96. Disponível em: https://ojst.is.cvut.cz/ojs/index.php/ap/article/view/96.. Acesso em: 12 may. 2025.