DOUBEK, J.; KREIDL, M. Parasitic Events in Envelope Analysis. Acta Polytechnica, [S. l.], v. 41, n. 6, 2001. DOI: 10.14311/282. Disponível em: https://ojst.is.cvut.cz/ojs/index.php/ap/article/view/282.. Acesso em: 6 jun. 2025.