FITEXC – DIFFRACTION PROFILE FITTING PROGRAM RUN IN MS EXCEL

Authors

  • Petr Vertat Department of Solid State Engineering, FNSPE CTU in Prague, Trojanova 13, 120 00, Prague 2, Czech Republic Department of Magnetic Measurements and Materials, Institute of Physics AS CR, Na Slovance 2, 182 21, Prague 8, Czech Republic
  • Jan Drahokoupil Department of Solid State Engineering, FNSPE CTU in Prague, Trojanova 13, 120 00, Prague 2, Czech Republic Department of Material Analysis, Institute of Physics AS CR, Na Slovance 2, 182 21, Prague 8, Czech Republic

DOI:

https://doi.org/10.14311/APP.2018.17.0020

Keywords:

X–ray diffraction, diffraction profile fitting, MS Excel

Abstract

We present our custom made diffraction fitting program FitExc for the basic treatment of the 1D diffraction profiles, in particular, the Intensity(2θ) of X-ray, synchrotron or neutron diffraction measurements. In the current state, the program allows for simultaneous fitting of up to three profiles in one data set and is intended to be used mainly for precise lattice parameters determination or fitting of overlapped peaks. The entire program is built in the common MS Excel environment, it does not require any installation and is free to use.

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Published

2018-06-26

Issue

Vol. 17 (2018): 7th STUDENT SCIENTIFIC CONFERENCE ON SOLID STATE PHYSICS AND PHYSICS OF MATERIALS

Section

Articles

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